The sub-Angstrom ARM200F, installed at IMM-CNR thanks to the Beyondnano project, has exceptional features which make one the most powerful analytic electron microscope in Europe. Its sophisticated hardware configuration combines spatial resolution and chemical contrast on a single image, allowing, element by element, the identification of the atomic structure of materials even at very low beam energy. Actually it is the first ARM200F worldwide able to work at an beam energy as low as 40KeV, allowing the investigation of soft materials and carbon-based structures, such as grapheme without damage.
The ARM200, is the only one that can guarantee such as performance inside a large industrial site, thanks to a laboratory entirely conceived and designed in Catania. What we call “The Active Lab”, with active suspension system, system for compensation of electromagnetic fields, radiant panel with control of the thermal stability of 0.06C / h, sound proof walls able to reduce more 1000 times outside noise.
Performances of Beyondnano ARM200F
| Beyond Nano JEOL S/TEM Cs-corrected ARM 200F | ||
|---|---|---|
| Beam Energy (KeV) | expected resolution | obtained STEM resolution (Å) |
| 200 | 0,78 | 0,68 |
| 100 | 1 | 0,83 |
| 60 | 1,3 | 1,1 |
| 40 | n.a. | 1,36 |
